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measured e ectively de nes the type of scanning probe microscopy: when the interaction measured is the force between atoms at the end of the tip and atoms in the specimen, the technique is called atomic force microscopy (AFM); when the quantum mechanical tunneling current is measured, the technique is called scanning tunneling microscopy (STM) These two techniques, atomic force microscopy and scanning tunneling microscopy have been the progenitors of a variety of scanning probe microscopy techniques that have emerged in recent years [31] Both scanning and electron microscopies are used to study the geometric structure of substances Scanning tunneling microscopy can determine the distance between the probe and the surface under study by exploiting the quantum tunneling e ect.

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Held near the surface of a material, the stylus probe generates an electric current into the surface; by making several passes over the surface, the location of the electron orbitals can be determined and the rate at which electrons tunnel quantum mechanically from the surface to the probe can be measured With this information, a graphic of individual atoms can be formed; moving the probe up and down over the surface produces a 3D image Scanning tunneling microscopy allows both the topographical and electrical properties of a material to be studied Scanning tunneling microscopy also permits the manipulation of atoms on the material s surface In scanning tunneling microscopy, electrons quantum mechanically tunnel between the tip and the surface of the sample This tunneling process is sensitive to overlaps between the electronic wave functions of the tip and of the sample (the tunneling depends exponentially on the separation).

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1032 Human injury The final aspect of blast analysis is the determination of the level of human injury Injury can be caused by primary, secondary, or tertiary blast effects Primary injury is caused by the direct effects of the high shock pressures associated with blast on the structure Typical primary injuries are blast lung and eardrum rupture Secondary injuries are those caused by fragments from the structure, or more typically a weapon system The final mechanism, tertiary injury, is that caused by the kinematic response of the structure and human All three of these mechanisms have the potential to cause severe injury, and should be considered in the blast assessment Primary injury may be assessed by comparing the predicted blast pressures, obtained from CFD or hand calculations, to standard injury data.

The scanning tunneling microscope makes use of this marked sensitivity to distance In actual use, the tip is scanned across the surface while a feedback circuit continuously adjusts the height of the tip above the sample to maintain a constant tunneling current The recorded trajectory of the tip creates an image that maps the electronic wave functions at the surface, revealing the atomic landscape in crisp detail [244] In another type of 3D atomic resolution microscopy, the atomic force microscope exploits various interatomic forces that occur when two objects are brought within nanometers of each other Similar in operation to the scanning tunneling microscopy, the atomic force microscope also creates three-dimensional images An atomic force microscope operates when the sharp silicon-tip probe contacts the surface, which causes a repulsive force, and/or when the probe is a few nanometers away, which results in an attractive force.

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Atomic force microscopy produces a topographic map of the sample as the probe moves over the sample surface Unlike most other scanning probe microscopy technologies, atomic force microscopy is not dependent on the electrical conductivity of the product being scanned, therefore atomic force microscopy can be used in ambient air or in a liquid environment The basic atomic force microscope is composed of a stylus-cantilever probe attached to the probe stage, a laser focused on the cantilever, a photodiode sensor (recording light re ected from the cantilever), a digital translator recorder, and, a data processor and monitor [447] Atomic force microscopy di ers from other scanning probe microscopy technologies because the probe makes physical (albeit gentle) contact with the sample The crux of this technology is the probe, which is composed of a surface-contacting stylus attached to an elastic cantilever mounted on a probe stage.